info:eu-repo/semantics/article
Analog Gross Fault Identification in RF Circuits using Neural Models and Constrained Parameter Extraction
Fecha
2019-06Registro en:
A. Viveros-Wacher, J. E. Rayas-Sánchez and Z. Brito-Brito, "Analog Gross Fault Identification in RF Circuits Using Neural Models and Constrained Parameter Extraction," in IEEE Transactions on Microwave Theory and Techniques, vol. 67, no. 6, pp. 2143-2150, June 2019. doi: 10.1109/TMTT.2019.2914106
0018-9480
Autor
Viveros-Wacher, Andrés
Rayas-Sánchez, José E.
Brito-Brito, Zabdiel
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