Analog Gross Fault Identification in RF Circuits using Neural Models and Constrained Parameter Extraction

dc.creatorViveros-Wacher, Andrés
dc.creatorRayas-Sánchez, José E.
dc.creatorBrito-Brito, Zabdiel
dc.date.accessioned2019-08-29T20:09:44Z
dc.date.accessioned2022-10-14T12:11:05Z
dc.date.available2019-08-29T20:09:44Z
dc.date.available2022-10-14T12:11:05Z
dc.date.created2019-08-29T20:09:44Z
dc.date.issued2019-06
dc.identifierA. Viveros-Wacher, J. E. Rayas-Sánchez and Z. Brito-Brito, "Analog Gross Fault Identification in RF Circuits Using Neural Models and Constrained Parameter Extraction," in IEEE Transactions on Microwave Theory and Techniques, vol. 67, no. 6, pp. 2143-2150, June 2019. doi: 10.1109/TMTT.2019.2914106
dc.identifier0018-9480
dc.identifierhttp://hdl.handle.net/11117/5997
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/4235515
dc.languageeng
dc.publisherIEEE
dc.rightshttp://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdf
dc.subjectAnalog Faults
dc.subjectArtificial Neural Networks (ANN)
dc.subjectGross Faults
dc.subjectFault Identification
dc.subjectFault Injection
dc.subjectParameter Extraction
dc.titleAnalog Gross Fault Identification in RF Circuits using Neural Models and Constrained Parameter Extraction
dc.typeinfo:eu-repo/semantics/article


Este ítem pertenece a la siguiente institución