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Correlation study between VAD preform deposition surface and germanium doping profiles
(Ieee-inst Electrical Electronics Engineers IncPiscatawayEUA, 2006)
Dependence of H-2/O-2 ratio and GeO2 content on the enhancement of second-order non-linearity related defects in Ge-doped optical fiber preforms
(Elsevier Science SaLausanneSuíça, 2004)
Automation for monitoring of the refractive index profile of vapor-phase-deposited soot preforms for optical fiber
(Amer Inst PhysicsMelvilleEUA, 2006)
Very shallow boron junctions in Si by implantation and SOD diffusion obtained by RTP
(Elsevier Ltd, 2008)
Very shallow boron junctions in Si by implantation and SOD diffusion obtained by RTP
(Elsevier Ltd, 2008)