Artículos de revistas
Correlation study between VAD preform deposition surface and germanium doping profiles
Registro en:
Journal Of Lightwave Technology. Ieee-inst Electrical Electronics Engineers Inc, v. 24, n. 2, n. 831, n. 837, 2006.
0733-8724
WOS:000235297600023
10.1109/JLT.2005.861936
Autor
dos Santos, JS
Ono, E
Gusken, E
Suzuki, CK
Institución
Resumen
The refractive index profile of germanium doped preforms for optical fibers is determined by the radial distribution of germanium concentration. Knowing that there is a correlation between the germanium doping profile and the deposition surface profile of vapor-phase axial deposition (VAD) preforms, the study of this correlation has been carried out in order to estimate, indirectly, the refractive index profile of VAD preforms for optical fibers during the deposition stage. This correlation was studied through the parameterization of the preform deposition surface using two parameters: the power law index profile that best fits the preform bottom profile (alpha) and the axial distance from the bottom tip to a reference height (h). A range of values of these parameters to produce VAD preforms with standard and special doping profiles has been presented. Preforms with triangular index profile can be fabricated with alpha and h values of about 2.0 and 5.0 mm, respectively, and preforms with parabolic index profiles can be produced with alpha and h values of about 2.0 and 4.0 mm, respectively. 24 2 831 837