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Nonlinear control system applied to atomic force microscope including parametric errors
(2013-06-01)
The performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In ...
Nonlinear control system applied to atomic force microscope including parametric errors
(2013-06-01)
The performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In ...
Microcantilever chaotic motion suppression in tapping mode atomic force microscope
(2013-08-01)
The tapping mode is one of the mostly employed techniques in atomic force microscopy due to its accurate imaging quality for a wide variety of surfaces. However, chaotic microcantilever motion impairs the obtention of ...
Microcantilever chaotic motion suppression in tapping mode atomic force microscope
(2013-08-01)
The tapping mode is one of the mostly employed techniques in atomic force microscopy due to its accurate imaging quality for a wide variety of surfaces. However, chaotic microcantilever motion impairs the obtention of ...
Reliable, Built-in, High-Accuracy Force Sensing for Legged Robots
(2006-06-28)
An approach for achieving reliable, built-in, high-accuracy force sensing for legged robots is presented, based on direct exploitation of the properties of a robot’s mechanical structure. The proposed methodology relies ...
PD-like controller with impedance for delayed bilateral teleoperation of mobile robots
(Cambridge University Press, 2015-04-15)
This paper proposes a control scheme applied to the delayed bilateral teleoperation of mobile robots with force feedback in face of asymmetric and time-varying delays. The scheme is managed by a velocity PD-like control ...
Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope
(2014-01-01)
During the last 30 years the Atomic Force Microscopy became the most powerful tool for surface probing in atomic scale. The Tapping-Mode Atomic Force Microscope is used to generate high quality accurate images of the samples ...
Preventing chaotic motion in tapping-mode atomic force microscope
(2014)
During the last 30 years the Atomic Force Microscopy became the most powerful tool for surface probing in atomic scale. The Tapping-Mode Atomic Force Microscope is used to generate high quality accurate images of the samples ...