Artículos de revistas
Preventing chaotic motion in tapping-mode atomic force microscope
Fecha
2014Registro en:
Journal of Control, Automation and Electrical Systems, v. 25, n. 6, p. 732-740, 2014.
2195-3899
9728054402919622
9290715282345636
1204232509410955
7416585768192991
Autor
Universidade Estadual Paulista (Unesp)
Universidade de São Paulo (USP)
Universidade Tecnológica Federal do Paraná (UTFPR)
Institución
Resumen
During the last 30 years the Atomic Force Microscopy became the most powerful tool for surface probing in atomic scale. The Tapping-Mode Atomic Force Microscope is used to generate high quality accurate images of the samples surface. However, in this mode of operation the microcantilever frequently presents chaotic motion due to the nonlinear characteristics of the tip-sample forces interactions, degrading the image quality. This kind of irregular motion must be avoided by the control system. In this work, the tip-sample interaction is modelled considering the Lennard-Jones potentials and the two-term Galerkin aproximation. Additionally, the State Dependent Ricatti Equation and Time-Delayed Feedback Control techniques are used in order to force the Tapping-Mode Atomic Force Microscope system motion to a periodic orbit, preventing the microcantilever chaotic motion