Artículos de revistas
Nonlinear control system applied to atomic force microscope including parametric errors
Fecha
2013-06-01Registro en:
Journal of Control, Automation and Electrical Systems, v. 24, n. 3, p. 223-231, 2013.
2195-3880
2195-3899
10.1007/s40313-013-0034-1
2-s2.0-84879400236
Autor
Universidade Estadual Paulista (Unesp)
Universidade Tecnológica Federal Do Paraná - UTFPR
Institución
Resumen
The performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In addition, the sensitivity of each control technique regarding to parametric uncertainties are considered. Simulation results show the advantages and disadvantages of each technique. © 2013 Brazilian Society for Automatics - SBA.
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