Extended focused image in white light scanning interference microscopy
Fecha
2019Registro en:
Altamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group.
Altamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group.
Universidad Tecnológica de Bolívar
Repositorio Universidad Tecnológica de Bolívar
Autor
Altamar-Mercado, Hernando
Patiño-Vanegas, Alberto
Marrugo, Andrés G.
Resumen
We propose a method to obtain a fringe-free extended focused image in white light scanning interference microscopy based on processing the stack of images over a range within the coherence length of the source. © 2019 The Author(s).