Extended focused image in white light scanning interference microscopy

dc.creatorAltamar-Mercado, Hernando
dc.creatorPatiño-Vanegas, Alberto
dc.creatorMarrugo, Andrés G.
dc.date.accessioned2023-07-19T21:26:04Z
dc.date.accessioned2023-09-06T15:48:50Z
dc.date.available2023-07-19T21:26:04Z
dc.date.available2023-09-06T15:48:50Z
dc.date.created2023-07-19T21:26:04Z
dc.date.issued2019
dc.identifierAltamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group.
dc.identifierhttps://hdl.handle.net/20.500.12585/12241
dc.identifierAltamar-Mercado, H., Patiño-Vanegas, A., & Marrugo, A. G. (2019, June). Extended focused image in white light scanning interference microscopy. In Imaging Systems and Applications (pp. ITh1C-3). Optica Publishing Group.
dc.identifierUniversidad Tecnológica de Bolívar
dc.identifierRepositorio Universidad Tecnológica de Bolívar
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8683135
dc.description.abstractWe propose a method to obtain a fringe-free extended focused image in white light scanning interference microscopy based on processing the stack of images over a range within the coherence length of the source. © 2019 The Author(s).
dc.languageeng
dc.publisherCartagena de Indias
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.rightsinfo:eu-repo/semantics/openAccess
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional
dc.sourceOptics InfoBase Conference Papers
dc.titleExtended focused image in white light scanning interference microscopy


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