Speckle interferometry single-shot applications with multiple carrier-fringe information
Fecha
2023-06-15Registro en:
Estiven Sánchez Barrera, "Speckle interferometry single-shot applications
with multiple carrier-fringe information," Proc. SPIE 12524, Dimensional
Optical Metrology and Inspection for Practical Applications XII
, 1252402 (15 June 2023); doi: 10.1117/12.2662369
0277-786X
Universidad Tecnológica de Bolívar
Repositorio Universidad Tecnológica de Bolívar
Autor
Sánchez Barrera, Estiven
Resumen
The need for robust equipment that allows identifying defects or measuring small displacements in a harsh
environment has been a requirement in the aeronautical and principally in the Oil & Gas industry. In this
field, Digital Speckle Pattern Interferometry and shearography had been the optical techniques more used.
Recently, advances in the process of phase images through multiple carrier frequencies had allowed compact
optical configurations that can combine multiple acquisitions or even multiple techniques in an simple process of
capture. This article shows the different applications, versatility, and compactness of the use of carrier frequencies
through the multiple aperture principle.