dc.creatorSánchez Barrera, Estiven
dc.date.accessioned2023-07-27T20:24:53Z
dc.date.accessioned2023-09-06T15:42:43Z
dc.date.available2023-07-27T20:24:53Z
dc.date.available2023-09-06T15:42:43Z
dc.date.created2023-07-27T20:24:53Z
dc.date.issued2023-06-15
dc.identifierEstiven Sánchez Barrera, "Speckle interferometry single-shot applications with multiple carrier-fringe information," Proc. SPIE 12524, Dimensional Optical Metrology and Inspection for Practical Applications XII , 1252402 (15 June 2023); doi: 10.1117/12.2662369
dc.identifier0277-786X
dc.identifierhttps://hdl.handle.net/20.500.12585/12442
dc.identifierUniversidad Tecnológica de Bolívar
dc.identifierRepositorio Universidad Tecnológica de Bolívar
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8682491
dc.description.abstractThe need for robust equipment that allows identifying defects or measuring small displacements in a harsh environment has been a requirement in the aeronautical and principally in the Oil & Gas industry. In this field, Digital Speckle Pattern Interferometry and shearography had been the optical techniques more used. Recently, advances in the process of phase images through multiple carrier frequencies had allowed compact optical configurations that can combine multiple acquisitions or even multiple techniques in an simple process of capture. This article shows the different applications, versatility, and compactness of the use of carrier frequencies through the multiple aperture principle.
dc.languageeng
dc.publisherCartagena de Indias
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.titleSpeckle interferometry single-shot applications with multiple carrier-fringe information


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