info:eu-repo/semantics/conferencePaper
Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction
Registro en:
J. E. Rayas-Sánchez, “Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction,” in Second Int. Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization (SMSMEO-06), Lyngby, Denmark, Nov. 2006.
Autor
Rayas-Sánchez, José E.
Institución
Resumen
Statistical analysis and yield estimation of high-frequency electronic circuits are critical steps for manufacturability-driven design. Accurate yield prediction typically requires massive amounts of computationally intensive high-fidelity simulations, such as full-wave electromagnetic (EM) simulations, to cover the entire statistic of possible outcomes of a given manufacturing process. ITESO, A.C. Consejo Nacional de Ciencia y Tecnología