info:eu-repo/semantics/conferencePaper
EM-based statistical analysis and yield estimation using linear-input and neural-output space mapping
Registro en:
J. E. Rayas-Sánchez and V. Gutiérrez-Ayala, “EM-based statistical analysis and yield estimation using linear-input and neural-output space mapping,” in IEEE MTT-S Int. Microwave Symp. Dig., San Francisco, CA, Jun. 2006, pp. 1597-1600. (ISSN: 0149-645X; E-ISBN: 0-7803-7542-5; P-ISBN: 0-7803-9541-7; INSPEC: 9098190; DOI: 10.1109/MWSYM.2006.249641)
Autor
Rayas-Sánchez, José E.
Gutiérrez-Ayala, Vladimir
Institución
Resumen
We propose a method for highly accurate
electromagnetics-based statistical analysis and yield calculations
around a space mapped nominal solution for RF and microwave
circuits. Our method consists of applying a constrained
Broyden-based linear input mapping approach to design,
followed by an output neural mapping modeling process in which
not only the responses but the design parameters and
independent variable are used as inputs to the output neural
network. We illustrate the accuracy of our technique using a
classical synthetic problem. ITESO, A.C. Consejo Nacional de Ciencia y Tecnología