Objeto de conferencia
Desarrollo de modelos de fallas de de sistemas electrónicos utilizando redes bayesianas
Registro en:
isbn:978-950-34-0749-3
Autor
Roca, José Luis
Institución
Resumen
The scope of the present work is focused in the use of Belief Bayesian Nets (BBN) in order to model complex electronic system failures with hardware and built-in software. The theory of Bayesian networks can be thought as a fusion of influence diagrams and Bayes Theorem. The present analysis emphasizes their use in replacement of the conventional Fault Tree Analysis (FTA). A later study of software necessary to implement their application completes the proposed objective. Sección: Diseño de hardware FPGA Centro de Técnicas Analógico-Digitales