info:eu-repo/semantics/article
PolishEM: Image enhancement in FIB-SEM
Fecha
2020-03Registro en:
Fernandez, Jose Jesus; Torres Molina, Teobaldo Enrique; Martin Solana, Eva; Goya, Gerardo Fabian; Fernandez Fernandez, Maria Rosario; PolishEM: Image enhancement in FIB-SEM; Oxford University Press; Bioinformatics (Oxford, England); 36; 12; 3-2020; 3947-3948
1367-4803
CONICET Digital
CONICET
Autor
Fernandez, Jose Jesus
Torres Molina, Teobaldo Enrique
Martin Solana, Eva
Goya, Gerardo Fabian
Fernandez Fernandez, Maria Rosario
Resumen
We have developed a software tool to improve the image quality in focused ion beam-scanning electron microscopy (FIB-SEM) stacks: PolishEM. Based on a Gaussian blur model, it automatically estimates and compensates for the blur affecting each individual image. It also includes correction for artifacts commonly arising in FIB-SEM (e.g. curtaining). PolishEM has been optimized for an efficient processing of huge FIB-SEM stacks on standard computers.