dc.creatorFernandez, Jose Jesus
dc.creatorTorres Molina, Teobaldo Enrique
dc.creatorMartin Solana, Eva
dc.creatorGoya, Gerardo Fabian
dc.creatorFernandez Fernandez, Maria Rosario
dc.date.accessioned2021-02-23T12:51:55Z
dc.date.accessioned2022-10-15T12:33:17Z
dc.date.available2021-02-23T12:51:55Z
dc.date.available2022-10-15T12:33:17Z
dc.date.created2021-02-23T12:51:55Z
dc.date.issued2020-03
dc.identifierFernandez, Jose Jesus; Torres Molina, Teobaldo Enrique; Martin Solana, Eva; Goya, Gerardo Fabian; Fernandez Fernandez, Maria Rosario; PolishEM: Image enhancement in FIB-SEM; Oxford University Press; Bioinformatics (Oxford, England); 36; 12; 3-2020; 3947-3948
dc.identifier1367-4803
dc.identifierhttp://hdl.handle.net/11336/126303
dc.identifierCONICET Digital
dc.identifierCONICET
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/4386442
dc.description.abstractWe have developed a software tool to improve the image quality in focused ion beam-scanning electron microscopy (FIB-SEM) stacks: PolishEM. Based on a Gaussian blur model, it automatically estimates and compensates for the blur affecting each individual image. It also includes correction for artifacts commonly arising in FIB-SEM (e.g. curtaining). PolishEM has been optimized for an efficient processing of huge FIB-SEM stacks on standard computers.
dc.languageeng
dc.publisherOxford University Press
dc.relationinfo:eu-repo/semantics/altIdentifier/url/https://academic.oup.com/bioinformatics/advance-article/doi/10.1093/bioinformatics/btaa218/5813331
dc.relationinfo:eu-repo/semantics/altIdentifier/doi/http://dx.doi.org/10.1093/bioinformatics/btaa218
dc.rightshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.rightsinfo:eu-repo/semantics/restrictedAccess
dc.subjectFIB-SEM
dc.subjectIMAGE ENHANCEMENT
dc.subjectCELLS
dc.subjectELECTRON MICROSCOPY
dc.titlePolishEM: Image enhancement in FIB-SEM
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:ar-repo/semantics/artículo
dc.typeinfo:eu-repo/semantics/publishedVersion


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