dc.contributorUniversidade Estadual Paulista (Unesp)
dc.contributorUniversidade Tecnológica Federal Do Paraná - UTFPR
dc.date.accessioned2014-05-27T11:29:34Z
dc.date.available2014-05-27T11:29:34Z
dc.date.created2014-05-27T11:29:34Z
dc.date.issued2013-06-01
dc.identifierJournal of Control, Automation and Electrical Systems, v. 24, n. 3, p. 223-231, 2013.
dc.identifier2195-3880
dc.identifier2195-3899
dc.identifierhttp://hdl.handle.net/11449/75502
dc.identifier10.1007/s40313-013-0034-1
dc.identifier2-s2.0-84879400236
dc.description.abstractThe performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In addition, the sensitivity of each control technique regarding to parametric uncertainties are considered. Simulation results show the advantages and disadvantages of each technique. © 2013 Brazilian Society for Automatics - SBA.
dc.languageeng
dc.relationJournal of Control, Automation and Electrical Systems
dc.relation0,274
dc.relation0,274
dc.rightsAcesso restrito
dc.sourceScopus
dc.subjectAtomic force microscopy (AFM)
dc.subjectChaos
dc.subjectOptimal linear feedback control (OLFC)
dc.subjectState-dependent Riccati equation (SDRE)
dc.subjectAtomic force microscope (AFM)
dc.subjectChaotic motions
dc.subjectControl techniques
dc.subjectLinear feedback control
dc.subjectParametric errors
dc.subjectParametric uncertainties
dc.subjectState-dependent Riccati equation
dc.subjectChaos theory
dc.subjectFeedback control
dc.subjectOptimization
dc.subjectAtomic force microscopy
dc.titleNonlinear control system applied to atomic force microscope including parametric errors
dc.typeArtículos de revistas


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