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Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
(2017-03-23)
The fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various ...
Separating the influence of electric charges in magnetic force microscopy images of inhomogeneous metal samples
(2018-01-15)
In this study, we investigate artifacts arising from electric charges present in magnetic force microscopy images. Therefore, we use two austenitic steel samples with different microstructural conditions. Furthermore, we ...
Nanobiosensors exploiting specific interactions between an enzyme and herbicides in atomic force spectroscopy
(American Scientific Publishers - ASPValencia, 2014-09)
The development of sensitive methodologies for detecting agrochemicals has become important in recent years due to the increasingly indiscriminate use of these substances. In this context, nanosensors based on atomic force ...
Forced oscillations with continuum models of atomic force microscopy
(2012-12-01)
The dynamics of the AFM-atomic force microscope follows a model based in a Timoshenko cantilever beam with a tip attached at the free end and acting with the surface of a sample. General boundary conditions arise when the ...
Forced Labour and Deportations in Ancient Egypt: Recent Trends and Future Possibilities
(Universidad Nacional de Rosario. Facultad de Humanidades y Artes. Centro de Estudios Sobre Diversidad Cultural, 2021)
A new method for extending the range of conductive polymer sensors for contact force
(Elsevier B.V., 2014)