Otro
Forced oscillations with continuum models of atomic force microscopy
Registro en:
AIP Conference Proceedings, v. 1493, p. 230-237.
0094-243X
1551-7616
10.1063/1.4765494
2-s2.0-84873157379.pdf
2-s2.0-84873157379
Autor
Claeyssen, Julio R.
Tsukazan, Teresa
Tonetto, Leticia
Balthazar, José Manoel
Resumen
The dynamics of the AFM-atomic force microscope follows a model based in a Timoshenko cantilever beam with a tip attached at the free end and acting with the surface of a sample. General boundary conditions arise when the tip is either in contact or non-contact with the surface. The governing equations are given in matrix conservative form subject to localized loads. The eigenanalysis is done with a fundamental matrix response of a damped second-order matrix differential equation. Forced responses are found by using a Galerkin approximation of the matrix impulse response. Simulations results with harmonic and pulse forcing show the filtering character and the effects of the tip-sample interaction at the end of the beam. © 2012 American Institute of Physics.