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Ohmic contacts with palladium diffusion barrier on III-V semiconductors
(2012-11-27)
Ohmic contacts with a palladium (Pd) diffusion barrier were formed on GaAs su bstrates. The metal contact structure consists of a gold-based-alloy /Pd/semiconductor-substrate. Characteristics of the ...
Transporte electrónico en silicio poroso nanoestructurado
(2013-03-25)
En este trabajo se fabricaron dispositivos basados en silicio poroso nanoestructurado, con el fin de estudiar y caracterizar sus propiedades de transporte eléctrico, buscando acumular datos que permitan en un futuro ...
Característica Intensidad-Voltaje en el contacto metal – semiconductor superconductor
(Universidad Nacional de Trujillo, 2020)
Característica Intensidad-Voltaje en el contacto metal – semiconductor superconductor
(Universidad Nacional de Trujillo, 2020)
RESUMEN
En el presente trabajo, se ha realizado un estudio del comportamiento Voltaje – Corriente de las uniones metal – semiconductor en el estado superconductor. Se obtuvo la densidad de corriente total, J, en el punto ...
Separating interface state response from parasitic effects in conductance measurements on organic metal-insulator-semiconductor capacitors
(American Institute of Physics (AIP), 2008-03-01)
A simple model is developed for the admittance of a metal-insulator-semiconductor (MIS) capacitor which includes the effect of a guard ring surrounding the Ohmic contact to the semiconductor. The model predicts most of the ...
Monolayer of PtSe2 on Pt(1 1 1): Is it metallic or insulating?
(IOP Publishing, 2020-03)
Motivated by the recent synthesis of a PtSe2 monolayer by direct selenization of a Pt(1 1 1) substrate and in order to reproduce ARPES experimental results, we investigate if the PtSe2 film could have grown directly on top ...
Fuerza termoelectromotriz en semiconductores bipolares: nuevo punto de vista
(Revista Mexicana de Física, 2009)
Resistive switching in rectifying interfaces of metal-semiconductor-metal structures
(American Institute of Physics, 2013-08)
We study the electrical characteristics of metal-semiconductor-metal HfO2_x-based devices where both metal-semiconductor interfaces present bipolar resistive switching. The device exhibits an unusual current-voltage ...
Separating interface state response from parasitic effects in conductance measurements on organic metal-insulator-semiconductor capacitors
(American Institute of Physics (AIP), 2014)