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Dielectric properties characterization of high dielectric constant thick films
(John Wiley & Sons, 2010-10-01)
A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric ...
Hybrid nanomembrane-based capacitors for the determination of the dielectric constant of semiconducting molecular ensembles
(2018-05-02)
Considerable advances in the field of molecular electronics have been achieved over the recent years. One persistent challenge, however, is the exploitation of the electronic properties of molecules fully integrated into ...
Sintering temperature influence on microwave dielectric properties of TiO2-ZrO2 ceramics
(2010-12-15)
Dielectric ceramics have been widely investigated and used for microwave applications such as resonators and filters. The present study deals with the influence of sintering temperature on microwave dielectric properties ...
Sintering temperature influence on microwave dielectric properties of TiO2-ZrO2 ceramics
(2010-12-15)
Dielectric ceramics have been widely investigated and used for microwave applications such as resonators and filters. The present study deals with the influence of sintering temperature on microwave dielectric properties ...
Investigation of some dielectric properties of phosphate glasses doped with iron oxides, by a microwave technique
(ELSEVIER SCI LTD, 2010)
The effects of iron ions on dielectric properties of lithium sodium phosphate glasses were studied by non-usual, fast and non-destructive microwave techniques. The dielectric constant (epsilon`). insertion loss (L) and ...
Nearly constant loss in crystalline oxide-ion conductor Gd2Zr2O7
(Springer, 2014-03)
We present a study of the nearly constant loss regime in the oxide-ion conductor Gd2Zr2O7 by using Impedance Spectroscopy measurements. At enough low temperature, between 173 and 253 K, the dielectric loss is found to be ...
An integral equation analysis of two-dimensional dielectric gratings
(John Wiley & Sons IncNew YorkEUA, 1999)
A polaronic stacking fault defect model for CaCu3Ti4O12 material: an approach for the origin of the huge dielectric constant and semiconducting coexistent features
(Iop Publishing Ltd, 2009-03-07)
This paper proposes a polaronic stacking fault defect model as the origin of the huge dielectric properties in CaCu3Ti4O12 (CCTO) materials. The model reconciles the opposing views of researchers on both sides of the ...
A polaronic stacking fault defect model for CaCu3Ti4O12 material: an approach for the origin of the huge dielectric constant and semiconducting coexistent features
(Iop Publishing Ltd, 2009-03-07)
This paper proposes a polaronic stacking fault defect model as the origin of the huge dielectric properties in CaCu3Ti4O12 (CCTO) materials. The model reconciles the opposing views of researchers on both sides of the ...