info:eu-repo/semantics/article
Dielectric properties characterization of high dielectric constant thick films
Fecha
2010-10-01Registro en:
10982760
08952477
10.1002/mop.25440
Autor
Demenicis, Luciene S.
J. I. Marulanda
Lima, Rodolfo A. A.
Carvalho, Maria Cristina R.
Institución
Resumen
A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposit