Microcantilever chaotic motion suppression in tapping mode atomic force microscope

dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorBalthazar, José Manoel
dc.creatorTusset, Angelo Marcelo
dc.creatorDe Souza, Silvio Luiz Thomaz
dc.creatorBueno, Atila Madureira
dc.date2014-05-27T11:30:06Z
dc.date2016-10-25T18:52:04Z
dc.date2014-05-27T11:30:06Z
dc.date2016-10-25T18:52:04Z
dc.date2013-08-01
dc.date.accessioned2017-04-06T02:33:38Z
dc.date.available2017-04-06T02:33:38Z
dc.identifierProceedings of the Institution of Mechanical Engineers, Part C: Journal of Mechanical Engineering Science, v. 227, n. 8, p. 1730-1741, 2013.
dc.identifier0954-4062
dc.identifier2041-2983
dc.identifierhttp://hdl.handle.net/11449/76168
dc.identifierhttp://acervodigital.unesp.br/handle/11449/76168
dc.identifier10.1177/0954406212467933
dc.identifier2-s2.0-84884200499
dc.identifierhttp://dx.doi.org/10.1177/0954406212467933
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/896877
dc.descriptionThe tapping mode is one of the mostly employed techniques in atomic force microscopy due to its accurate imaging quality for a wide variety of surfaces. However, chaotic microcantilever motion impairs the obtention of accurate images from the sample surfaces. In order to investigate the problem the tapping mode atomic force microscope is modeled and chaotic motion is identified for a wide range of the parameter's values. Additionally, attempting to prevent the chaotic motion, two control techniques are implemented: the optimal linear feedback control and the time-delayed feedback control. The simulation results show the feasibility of the techniques for chaos control in the atomic force microscopy. © 2012 IMechE.
dc.languageeng
dc.relationProceedings of the Institution of Mechanical Engineers, Part C: Journal of Mechanical Engineering Science
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectAtomic force microscopy
dc.subjectchaos
dc.subjectcontrol
dc.subjectnonlinear dynamics
dc.subjecttapping mode atomic force microscope
dc.subjectChaotic motions
dc.subjectControl techniques
dc.subjectImaging quality
dc.subjectLinear feedback control
dc.subjectMicro-cantilevers
dc.subjectSample surface
dc.subjectTapping modes
dc.subjectTime-delayed feedback
dc.subjectChaos theory
dc.subjectChaotic systems
dc.subjectComposite micromechanics
dc.subjectControl
dc.subjectDynamics
dc.subjectFeedback control
dc.titleMicrocantilever chaotic motion suppression in tapping mode atomic force microscope
dc.typeOtro


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