dc.contributor | Universidade Estadual Paulista (UNESP) | |
dc.creator | Claeyssen, Julio R. | |
dc.creator | Tsukazan, Teresa | |
dc.creator | Tonetto, Leticia | |
dc.creator | Balthazar, José Manoel | |
dc.date | 2014-05-27T11:27:17Z | |
dc.date | 2016-10-25T18:39:58Z | |
dc.date | 2014-05-27T11:27:17Z | |
dc.date | 2016-10-25T18:39:58Z | |
dc.date | 2012-12-01 | |
dc.date.accessioned | 2017-04-06T02:03:51Z | |
dc.date.available | 2017-04-06T02:03:51Z | |
dc.identifier | AIP Conference Proceedings, v. 1493, p. 230-237. | |
dc.identifier | 0094-243X | |
dc.identifier | 1551-7616 | |
dc.identifier | http://hdl.handle.net/11449/73794 | |
dc.identifier | http://acervodigital.unesp.br/handle/11449/73794 | |
dc.identifier | 10.1063/1.4765494 | |
dc.identifier | 2-s2.0-84873157379.pdf | |
dc.identifier | 2-s2.0-84873157379 | |
dc.identifier | http://dx.doi.org/10.1063/1.4765494 | |
dc.identifier.uri | http://repositorioslatinoamericanos.uchile.cl/handle/2250/894579 | |
dc.description | The dynamics of the AFM-atomic force microscope follows a model based in a Timoshenko cantilever beam with a tip attached at the free end and acting with the surface of a sample. General boundary conditions arise when the tip is either in contact or non-contact with the surface. The governing equations are given in matrix conservative form subject to localized loads. The eigenanalysis is done with a fundamental matrix response of a damped second-order matrix differential equation. Forced responses are found by using a Galerkin approximation of the matrix impulse response. Simulations results with harmonic and pulse forcing show the filtering character and the effects of the tip-sample interaction at the end of the beam. © 2012 American Institute of Physics. | |
dc.language | eng | |
dc.relation | AIP Conference Proceedings | |
dc.rights | info:eu-repo/semantics/closedAccess | |
dc.subject | Atomic force microscopy | |
dc.subject | forced responses | |
dc.subject | Galerkin method | |
dc.subject | impulse matrix response | |
dc.subject | Timoshenko beam | |
dc.title | Forced oscillations with continuum models of atomic force microscopy | |
dc.type | Otro | |