dc.contributorUniversidade Estadual Paulista (UNESP)
dc.creatorClaeyssen, Julio R.
dc.creatorTsukazan, Teresa
dc.creatorTonetto, Leticia
dc.creatorBalthazar, José Manoel
dc.date2014-05-27T11:27:17Z
dc.date2016-10-25T18:39:58Z
dc.date2014-05-27T11:27:17Z
dc.date2016-10-25T18:39:58Z
dc.date2012-12-01
dc.date.accessioned2017-04-06T02:03:51Z
dc.date.available2017-04-06T02:03:51Z
dc.identifierAIP Conference Proceedings, v. 1493, p. 230-237.
dc.identifier0094-243X
dc.identifier1551-7616
dc.identifierhttp://hdl.handle.net/11449/73794
dc.identifierhttp://acervodigital.unesp.br/handle/11449/73794
dc.identifier10.1063/1.4765494
dc.identifier2-s2.0-84873157379.pdf
dc.identifier2-s2.0-84873157379
dc.identifierhttp://dx.doi.org/10.1063/1.4765494
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/894579
dc.descriptionThe dynamics of the AFM-atomic force microscope follows a model based in a Timoshenko cantilever beam with a tip attached at the free end and acting with the surface of a sample. General boundary conditions arise when the tip is either in contact or non-contact with the surface. The governing equations are given in matrix conservative form subject to localized loads. The eigenanalysis is done with a fundamental matrix response of a damped second-order matrix differential equation. Forced responses are found by using a Galerkin approximation of the matrix impulse response. Simulations results with harmonic and pulse forcing show the filtering character and the effects of the tip-sample interaction at the end of the beam. © 2012 American Institute of Physics.
dc.languageeng
dc.relationAIP Conference Proceedings
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectAtomic force microscopy
dc.subjectforced responses
dc.subjectGalerkin method
dc.subjectimpulse matrix response
dc.subjectTimoshenko beam
dc.titleForced oscillations with continuum models of atomic force microscopy
dc.typeOtro


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