info:eu-repo/semantics/article
Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction
Fecha
2018-08Registro en:
A. Viveros-Wacher and J. E. Rayas-Sánchez, “Analog fault identification in RF circuits using artificial neural networks and constrained parameter extraction,” in IEEE MTT-S Int. Conf. Num. EM Mutiphysics Modeling Opt. (NEMO-2018), Reykjavik, Iceland, Aug. 2018, pp. 1-3. DOI: 10.1109/NEMO.2018.8503117
978-1-5386-5205-3
Autor
Viveros-Wacher, Andrés
Rayas-Sánchez, José E.
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