info:eu-repo/semantics/article
System-Level Measurement-Based Design Optimization by Space Mapping Technology
Fecha
2022-06-21Registro en:
J. E. Rayas-Sánchez and J. W. Bandler, “System‐level measurement‐based design optimization by space mapping technology,” in IEEE MTT-S Int. Microwave Symp. Dig., Denver CO, Jun. 2022, pp. 118-120. DOI: 10.1109/IMS37962.2022.9865412
978-1-6654-9614-8
0149-645X
Autor
Rayas-Sánchez, José E.
Bandler, John W.