PRAKTISCHE METALLOGRAPHIE-PRACTICAL METALLOGRAPHY

dc.creatorRamos-Moore, E
dc.date2021-08-23T22:47:57Z
dc.date2022-07-08T20:17:42Z
dc.date2021-08-23T22:47:57Z
dc.date2022-07-08T20:17:42Z
dc.date2016
dc.date.accessioned2023-08-22T03:40:04Z
dc.date.available2023-08-22T03:40:04Z
dc.identifier1150357
dc.identifier1150357
dc.identifierhttps://hdl.handle.net/10533/250047
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8316034
dc.descriptionMetallographic preparation is an art, especially when relevant information hidden at the micro-or nano-scale has to be unraveled. In particular, electron backscattered diffraction (EBSD) is a technique that provides valuable information of the microstructure of bulk and coatings. Indeed, information regarding evolution of the morphology, size and orientation of grains is very relevant for the design and fabrication of new commercial coatings. Metallographic preparation for EBSD analysis of hard coatings consisting of Al2O3 and TiCN layers is presented in this work. In particular, preparation timing during grinding and polishing is discussed. EBSD data is presented and correlated with the metallographic preparation parameters. The main conclusions of this work highlight the importance of systematic preparation of all the successive metallographic procedures and the understanding of the quality parameters associated with the EBSD scans and data processing.
dc.descriptionRegular 2015
dc.descriptionFONDECYT
dc.descriptionFONDECYT
dc.languageeng
dc.relationhandle/10533/111557
dc.relationhandle/10533/111541
dc.relationhandle/10533/108045
dc.relationhttps://doi.org/10.3139/147.110428
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 Chile
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/3.0/cl/
dc.rightsinfo:eu-repo/semantics/article
dc.rightsinfo:eu-repo/semantics/openAccess
dc.titleMetallographic Preparation of Hard Coatings for EBSD Analysis
dc.titlePRAKTISCHE METALLOGRAPHIE-PRACTICAL METALLOGRAPHY
dc.typeArticulo
dc.typeinfo:eu-repo/semantics/publishedVersion


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