MICROELECTRONICS JOURNAL

dc.creatorCeledon, C.
dc.creatorArista, N. R.
dc.creatorValdes, J. E.
dc.creatorVargas, P.
dc.date2016-12-05T15:35:40Z
dc.date2022-07-06T19:36:34Z
dc.date2016-12-05T15:35:40Z
dc.date2022-07-06T19:36:34Z
dc.date2008
dc.date.accessioned2023-08-22T01:48:45Z
dc.date.available2023-08-22T01:48:45Z
dc.identifier1070224
dc.identifier1070224
dc.identifier0959-8324
dc.identifierhttps://hdl.handle.net/10533/142186
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/8307747
dc.description4
dc.descriptionFONDECYT
dc.description11
dc.descriptionFONDECYT
dc.languageeng
dc.publisherELSEVIER SCI LTD
dc.relationinstname: Conicyt
dc.relationreponame: Repositorio Digital RI2.0
dc.relationinstname: Conicyt
dc.relationreponame: Repositorio Digital RI2.0
dc.relationinfo:eu-repo/grantAgreement/Fondecyt/1070224
dc.relationinfo:eu-repo/semantics/dataset/hdl.handle.net/10533/93477
dc.rightsinfo:eu-repo/semantics/openAccess
dc.titleThreshold effect in the energy loss of hydrogen and helium ions transmitted in channeling conditions in gold single crystal
dc.titleMICROELECTRONICS JOURNAL
dc.typeArticulo
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/publishedVersion
dc.coverageOXFORD


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