Electrical properties and spectroscopic ellipsometry studies of covellite CuS thin films deposited from non ammoniacal chemical bath

dc.creatorDiliegros-Godines C.J., Lombardero-Juarez D.I., Machorro-Mejía R., González R.S., Pal M.
dc.date2020-12-11T06:46:42Z
dc.date2020-12-11T06:46:42Z
dc.date2019
dc.date.accessioned2023-07-21T20:22:12Z
dc.date.available2023-07-21T20:22:12Z
dc.identifier2-s2.0-85063346438
dc.identifierhttp://repositorio.udlap.mx/xmlui/handle/123456789/13603
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7745726
dc.descriptionhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85063346438&doi=10.1016%2fj.optmat.2019.03.022&partnerID=40&md5=e683bdd2db6d22b6b4141c8eddab27b1
dc.sourceOptical Materials
dc.titleElectrical properties and spectroscopic ellipsometry studies of covellite CuS thin films deposited from non ammoniacal chemical bath
dc.typeArticle


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