dc.contributorAmerican Institute of Physics
dc.creatorCompeán García, Vicente Damián
dc.creatorOrozco Hinostroza, Ignacio Everardo
dc.creatorEscobosa Echavarria, Arturo
dc.creatorLópez Luna, Edgar
dc.creatorRodríguez Vázquez, Angel Gabriel
dc.date2018-04-03T19:23:00Z
dc.date2018-04-03T19:23:00Z
dc.date2014-05
dc.date.accessioned2023-07-17T22:04:40Z
dc.date.available2023-07-17T22:04:40Z
dc.identifierV. D. Compeán García, et al.. Applied Physics Letters 104, 191904 (2014); https://doi.org/10.1063/1.4876760 © 2014 AIP Publishing LLC.
dc.identifierhttp://hdl.handle.net/11627/3745
dc.identifierhttps://doi.org/10.1063/1.4876760
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7544058
dc.description"High crystalline layers of InN were grown on MgO(100) substrates by gas source molecular beam epitaxy. Good quality films were obtained by means of an in-plane rotation process induced by the annealing of an InN buffer layer to minimize the misfit between InN and MgO. In situ reflection high-energy electron diffraction showed linear streaky patterns along the [01 (1) over bar0] azimuth and a superimposed diffraction along the [11 (2) over bar0] azimuth, which correspond to a 30 degrees alpha-InN film rotation. This rotation reduces the mismatch at the MgO/InN interface from 19.5% to less than 3.5%, increasing the structural quality, which was analyzed by high-resolution X-ray diffraction and Raman spectroscopy. Only the (0002) c plane diffraction of a-InN was observed and was centered at 2 theta = 31.4 degrees. Raman spectroscopy showed two modes corresponding to the hexagonal phase: E1(LO) at 591 cm(-1) and E2(high) at 488 cm(-1). Hall effect measurements showed a carrier density of 9 x 10(18) cm(-3) and an electron Hall mobility of 340 cm (2)/(V s) for a film thickness of 140 nm."
dc.formatapplication/pdf
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.rightsAcceso Abierto
dc.subjectFÍSICA
dc.titleHigh-quality InN films on MgO (100) substrates: the key role of 30 degrees in-plane rotation
dc.typearticle


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