Effect of an electric field within microscopy focused ion beam (FIB) between manipulator sharp and the ion trap of the electron detector

dc.contributorAcademic Journals
dc.creatorGómez, Jorge Alberto
dc.creatorPérez Hernández, Antonio
dc.creatorDuarte Moller, José Alberto
dc.date2018-12-13T21:09:20Z
dc.date2018-12-13T21:09:20Z
dc.date2011
dc.date.accessioned2023-07-17T22:03:40Z
dc.date.available2023-07-17T22:03:40Z
dc.identifierGómez Jorge A., Pérez Hernández and A. Duarte-Moller, A. (2011). Effect of an electric field within microscopy focused ion beam (FIB) between manipulator sharp and the ion trap of the electron detector. International Journal of the Physical Sciences Vol. 6(22), pp. 5104-5108.
dc.identifierhttp://hdl.handle.net/11627/4813
dc.identifier10.5897/IJPS11.352
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/7543614
dc.description"The manipulation of samples with micro manipulators sharps in the normal axis to the observation plane is practically blind in microscopy focused ion beam (FIB) mono beam. The application of a negative potential to the manipulator sharp has been considered, which causes differences of electrical potential between the detector and the sample holder, generating an electric field between the sharp and the sample. This makes the electrons, aside the sample, undergo a greater deflection, reflecting in poorer contrast image. This deflection depends on a great extension of the sample holder height between the micromanipulator sharp, voltage deflector, q/m electron factor and electron acceleration."
dc.formatapplication/pdf
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.rightsAcceso Abierto
dc.subjectFocused ion beam (FIB) mono beam
dc.subjectContrast effects
dc.subjectElectric fields
dc.subjectHeight
dc.subjectFÍSICA
dc.titleEffect of an electric field within microscopy focused ion beam (FIB) between manipulator sharp and the ion trap of the electron detector
dc.typearticle


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