J. E. Rayas-Sánchez and V. Gutiérrez-Ayala, “EM-based statistical analysis and yield estimation using linear-input and neural-output space mapping,” in IEEE MTT-S Int. Microwave Symp. Dig., San Francisco, CA, Jun. 2006, pp. 1597-1600. (ISSN: 0149-645X; E-ISBN: 0-7803-7542-5; P-ISBN: 0-7803-9541-7; INSPEC: 9098190; DOI: 10.1109/MWSYM.2006.249641)

http://148.201.128.228:8080/xmlui/handle/20.500.12032/197

https://repositorioslatinoamericanos.uchile.cl/handle/2250/6177412