dc.creatorCoto, Raúl [Univ Mayor, Santiago, Chile]
dc.creatorNicolás, L.
dc.creatorDelord, T.
dc.creatorJamonneau, P.
dc.creatorMaze, J.
dc.creatorJacques, V.
dc.creatorHetet, G.
dc.date.accessioned2020-04-08T14:11:55Z
dc.date.accessioned2020-04-13T18:12:49Z
dc.date.accessioned2022-10-18T18:41:01Z
dc.date.available2020-04-08T14:11:55Z
dc.date.available2020-04-13T18:12:49Z
dc.date.available2022-10-18T18:41:01Z
dc.date.created2020-04-08T14:11:55Z
dc.date.created2020-04-13T18:12:49Z
dc.date.issued2018
dc.identifierNicolas, L., Delord, T., Jamonneau, P., Coto, R., Maze, J., Jacques, V., & Hétet, G. (2018). Coherent population trapping with a controlled dissipation: applications in optical metrology. New Journal of Physics, 20(3), 033007.
dc.identifier1367-2630
dc.identifierhttps://doi.org/10.1088/1367-2630/aab574
dc.identifierhttp://repositorio.umayor.cl/xmlui/handle/sibum/6241
dc.identifierDOI: 10.1088/1367-2630/aab574
dc.identifier.urihttps://repositorioslatinoamericanos.uchile.cl/handle/2250/4454084
dc.description.abstractWe analyze the properties of a pulsed coherent population trapping protocol that uses a controlled decay from the excited state in a Lambda-level scheme. We study this problem analytically and numerically and find regimes where narrow transmission, absorption, or fluorescence spectral lines occur. We then look for optimal frequency measurements using these spectral features by computing the Allan deviation in the presence of ground state decoherence and show that the protocol is on a par with Ramsey-CPT. We discuss possible implementations with ensembles of alkali atoms and single ions and demonstrate that typical pulsed-CPT experiments that are realized on femto-second timescales can be implemented on micro-seconds timescales using this scheme.
dc.languageen
dc.publisherIOP PUBLISHING LTD
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Chile
dc.sourceNew J. Phys., MAR 2018. 20
dc.subjectPhysics, Multidisciplinary
dc.titleCoherent population trapping with a controlled dissipation: applications in optical metrology
dc.typeArtículos de revistas


Este ítem pertenece a la siguiente institución