Structure and growth of vapor-deposited n-dotriacontane films studied by X-ray reflectivity

dc.creatorCampo Sfeir, Valeria I. del
dc.creatorCisternas Jara, Edgardo A.
dc.creatorVergara Kausel, Ignacio
dc.creatorCorrales, Tomás P.
dc.creatorSoza Ossandón, Pamela
dc.creatorVolkmann, Ulrich
dc.creatorTaub, Haskell
dc.creatorBai, Mengjun
dc.creatorWang, Siao-Kwan
dc.creatorHansen, Flemming Y.
dc.date.accessioned2020-09-04T15:55:03Z
dc.date.available2020-09-04T15:55:03Z
dc.date.created2020-09-04T15:55:03Z
dc.date.issued2009
dc.identifier10.1021/la901808t
dc.identifier0743-7463
dc.identifierhttps://doi.org/10.1021/la901808t
dc.identifierhttp://www.scopus.com/inward/record.url?eid=2-s2.0-71549167012&partnerID=MN8TOARS
dc.identifierhttps://repositorio.uc.cl/handle/11534/43710
dc.languageen
dc.relationLangmuir, vol 25, no. 22 (2009), pp. 12962–12967
dc.subjectThickness
dc.subjectX-rays
dc.subjectLayers
dc.subjectMolecules
dc.subjectOptical properties
dc.titleStructure and growth of vapor-deposited n-dotriacontane films studied by X-ray reflectivity
dc.typeartículo


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