info:eu-repo/semantics/article
Capacitance and resistance measurements of SnO2 thick-films
Fecha
2008-02-05Registro en:
Ponce, Miguel Adolfo; Castro, Miriam Susana; Aldao, Celso Manuel; Capacitance and resistance measurements of SnO2 thick-films; Springer; Journal of Materials Science: Materials in Electronics; 20; 1; 5-2-2008; 25-32
0957-4522
1573-482X
CONICET Digital
CONICET
Autor
Ponce, Miguel Adolfo
Castro, Miriam Susana
Aldao, Celso Manuel
Resumen
Impedance spectroscopy measurements on SnO2 thick films were carried out in an air atmosphere and for temperatures between 25 0C and 425 0C. Capacitance and resistance analyses reveal the mechanisms responsible for experimental responses. Four different contributions to the overall capacitance and resistance were distinguished and assigned to the bulk, the grain boundary, the electrodes, and the presence of deep traps. The effects of trap states on the electrical behavior of the sensor were explored and a modified equivalent circuit model is proposed.