dc.contributorPrior, Cesar Augusto
dc.creatorFerreira, Leonardo de Lima
dc.date.accessioned2021-11-03T15:19:16Z
dc.date.accessioned2022-10-07T22:44:08Z
dc.date.available2021-11-03T15:19:16Z
dc.date.available2022-10-07T22:44:08Z
dc.date.created2021-11-03T15:19:16Z
dc.date.issued2019-07-10
dc.identifierhttp://repositorio.ufsm.br/handle/1/22680
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/4038165
dc.description.abstractThe present work of conclusion of course approaches the implementation of test methods for characterization of Sigma-Delta type ADCs. For the construction and vali- dation of such methods, circuits modeled in the Matlab software of a second-order Sigma- Delta modulator were used. Through the simulation results, data were obtained that effected the development of the measurement methods, through the digital signal proces- sing and the respective basing of standards, as in the case of the IEEE 1241 standard. Subsequently, through a test bench, bitstream data was extracted from three second or- der Sigma-Delta modulators in order to specify their characteristics through the methods described in this work. The test methods provide static and dynamic specifications, such as static gain, offset voltage, DNL and INL, referring to the former and, SNR, SINAD, ENOB, THD and dynamic range, referring to the latter.
dc.publisherUniversidade Federal de Santa Maria
dc.publisherBrasil
dc.publisherUFSM
dc.publisherCentro de Tecnologia
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.rightsAcesso Aberto
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 International
dc.subjectProcessamento digital de sinais
dc.subjectConversor sigma-delta
dc.subjectMétodos de testes
dc.subjectConversor analógico-digital
dc.titleDesenvolvimento de métodos de testes para caracterização de ADCS do tipo Σ∆
dc.typeTrabalho de Conclusão de Curso de Graduação


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