Artigo de Periódico
Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
Fecha
2007Autor
Rosa, R. R.
Baroni, M. P. M. A.
Zaniboni, G. T.
Silva, A. Ferreira da
Roman, L. S.
Pontes, J.
Bolzan, M. J. A.
Rosa, R. R.
Baroni, M. P. M. A.
Zaniboni, G. T.
Silva, A. Ferreira da
Roman, L. S.
Pontes, J.
Bolzan, M. J. A.
Institución
Resumen
This paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological interpretation indicate that the proposed measure is efficient for quantitatively characterize the structural complexity of disordered surfaces (and interfaces) observed and/or simulated in nano, micro and ordinary scales.