Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns

dc.creatorRosa, R. R.
dc.creatorBaroni, M. P. M. A.
dc.creatorZaniboni, G. T.
dc.creatorSilva, A. Ferreira da
dc.creatorRoman, L. S.
dc.creatorPontes, J.
dc.creatorBolzan, M. J. A.
dc.creatorRosa, R. R.
dc.creatorBaroni, M. P. M. A.
dc.creatorZaniboni, G. T.
dc.creatorSilva, A. Ferreira da
dc.creatorRoman, L. S.
dc.creatorPontes, J.
dc.creatorBolzan, M. J. A.
dc.date.accessioned2022-10-07T18:56:56Z
dc.date.available2022-10-07T18:56:56Z
dc.date.issued2007
dc.identifierhttp://repositorio.ufba.br/ri/handle/ri/14664
dc.identifierv. 386, n. 2
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/4012625
dc.description.abstractThis paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological interpretation indicate that the proposed measure is efficient for quantitatively characterize the structural complexity of disordered surfaces (and interfaces) observed and/or simulated in nano, micro and ordinary scales.
dc.languageen
dc.rightsAcesso Aberto
dc.sourcehttp://dx.doi.org/10.1016/j.physa.2007.08.044
dc.subjectDisordered surfaces
dc.subjectStructural complexity
dc.subjectGradient pattern analysis
dc.subjectWavelet multiresolution analysis
dc.subjectEuler characteristic
dc.subjectKPZ equation
dc.subjectPorous silicon
dc.titleStructural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
dc.typeArtigo de Periódico


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