dc.contributorCarara, Marcos André
dc.contributorhttp://lattes.cnpq.br/1334485128053939
dc.contributorDenardin, Juliano Casagrande
dc.contributorhttp://lattes.cnpq.br/5425237044575885
dc.contributorViegas, Alexandre Da Cas
dc.contributorhttp://lattes.cnpq.br/5936503285330202
dc.contributorOliveira, Artur Harres de
dc.contributorhttp://lattes.cnpq.br/5413344891000141
dc.contributorSilva, Leandro Barros da
dc.contributorhttp://lattes.cnpq.br/2500664315353832
dc.creatorKern, Paula Roberta
dc.date.accessioned2019-04-18T18:50:57Z
dc.date.accessioned2019-05-24T19:57:44Z
dc.date.available2019-04-18T18:50:57Z
dc.date.available2019-05-24T19:57:44Z
dc.date.created2019-04-18T18:50:57Z
dc.date.issued2018-12-04
dc.identifierhttp://repositorio.ufsm.br/handle/1/16267
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/2837843
dc.description.abstractThe exchange bias (EB) arises, generally, from the interfacial coupling between a ferromagnetic layer (FM) and an antiferromagnetic layer (AFM). The most well-known manifestations of this phenomenon, in samples with a FM/AFM interface, are the field shift in the magnetization curves and the increase in the coercive field when compared to the uncoupled FM material. Many experimental results have shown that the exchange bias field (Heb) and coercivity (HC) in FM/AFM bilayers are inversely proportional to the FM layer thickness. On the other hand, the relationship between these parameters and the AFM layer is more complicated and the particularities of each system will define how the evolution of Heb and HC with the AFM thickness will be. The general rule is that there exists a critical thickness of the AFM below which the EB vanishes. In this thesis, in order to investigate the emergence and evolution of EB as a function of the AFM layer thickness, NiFe(50 nm)/FeMn(tAFM) bilayers were produced with 3 nm tAFM 30 nm. The work was carried out by means of structural and magnetic characterization techniques, such as X-ray reflectivity and diffraction, magnetometry and ferromagnetic resonance (at a fixed frequency and broadband). The results obtained by static and dynamic magnetic characterization have shown that, for this FM/AFM system, the EB arises when tAFM 6 nm. A description of the angular evolution of the ferromagnetic resonance field, considering the Zeeman, demagnetization, uniaxial, unidirectional and rotatable energies, confirmed the existence of a misalignment between the uniaxial and unidirectional anisotropies axes, which was found to be dependent on the AFM layer thickness. In addition, the evaluation of the ferromagnetic resonance linewidth as a function of temperature, performed for two samples, presented a peak at approximately 75 K, which was interpreted in terms of inomogeneities in the samples.
dc.publisherUniversidade Federal de Santa Maria
dc.publisherBrasil
dc.publisherFísica
dc.publisherUFSM
dc.publisherPrograma de Pós-Graduação em Física
dc.publisherCentro de Ciências Naturais e Exatas
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 International
dc.subjectExchange bias
dc.subjectRessonância ferromagnética
dc.subjectDesalinhamento
dc.subjectLargura de linha
dc.subjectAnisotropia
dc.subjectTemperatura
dc.subjectFerromagnetic resonance
dc.subjectMisalignment
dc.subjectLinewidth
dc.subjectAnisotropy
dc.subjectTemperature
dc.titleExchange bias em bicamadas de NiFe/FeMn: um estudo em função da espessura da camada antiferromagnética
dc.typeTese


Este ítem pertenece a la siguiente institución