Reliable full-wave EM simulation of a single-layer SIW interconnect with transitions to microstrip lines

dc.creatorRayas-Sánchez, José E.
dc.creatorChávez-Hurtado, José L.
dc.creatorBrito-Brito, Zabdiel
dc.date.accessioned2016-03-02T17:31:20Z
dc.date.available2016-03-02T17:31:20Z
dc.date.created2016-03-02T17:31:20Z
dc.date.issued2014-10
dc.identifierChávez-Hurtado, J.L.; Rayas-Sánchez,E. and Brito-Brito, Z. “Reliable full-wave EM simulation of a single-layer SIW interconnect with transitions to microstrip lines,” in COMSOL Conf., Boston, MA, Oct. 2014, pp. 1-5. (DOI: 10.13140/RG.2.1.2579.1445).
dc.identifierDOI: 10.13140/RG.2.1.2579.1445
dc.identifierhttp://hdl.handle.net/11117/3131
dc.languageeng
dc.publisherCOMSOL Conference
dc.relationCOMSOL Conference;
dc.rightshttp://quijote.biblio.iteso.mx/licencias/CC-BY-NC-2.5-MX.pdf
dc.subjectSimulation Bounding Box
dc.subjectMeshing Scheme
dc.subjectSIW
dc.subjectMicrostrip Line
dc.subjectInterconnect
dc.subjectEM Simulation
dc.titleReliable full-wave EM simulation of a single-layer SIW interconnect with transitions to microstrip lines
dc.typeinfo:eu-repo/semantics/conferencePaper


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