Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction

dc.creatorRayas-Sánchez, José E.
dc.date.accessioned2013-05-21T17:03:36Z
dc.date.available2013-05-21T17:03:36Z
dc.date.created2013-05-21T17:03:36Z
dc.date.issued2006-11
dc.identifierJ. E. Rayas-Sánchez, “Linear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction,” in Second Int. Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization (SMSMEO-06), Lyngby, Denmark, Nov. 2006.
dc.identifierhttp://hdl.handle.net/11117/597
dc.languageeng
dc.publisherInternational Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization
dc.relationSecond Int. Workshop on Surrogate Modeling and Space Mapping for Engineering Optimization;2006
dc.rightshttp://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdf
dc.subjectYield Estimation
dc.subjectHigh-frequency Electronic Circuits
dc.subjectElectromagnetic Based Design
dc.titleLinear-input and neural-output space mapping for highly accurate statistical analysis and yield prediction
dc.typeinfo:eu-repo/semantics/conferencePaper


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