EM-based statistical analysis and yield estimation using linear-input and neural-output space mapping

dc.creatorRayas-Sánchez, José E.
dc.creatorGutiérrez-Ayala, Vladimir
dc.date.accessioned2013-05-21T17:03:31Z
dc.date.available2013-05-21T17:03:31Z
dc.date.created2013-05-21T17:03:31Z
dc.date.issued2006-06
dc.identifierJ. E. Rayas-Sánchez and V. Gutiérrez-Ayala, “EM-based statistical analysis and yield estimation using linear-input and neural-output space mapping,” in IEEE MTT-S Int. Microwave Symp. Dig., San Francisco, CA, Jun. 2006, pp. 1597-1600. (ISSN: 0149-645X; E-ISBN: 0-7803-7542-5; P-ISBN: 0-7803-9541-7; INSPEC: 9098190; DOI: 10.1109/MWSYM.2006.249641)
dc.identifierhttp://hdl.handle.net/11117/596
dc.languageeng
dc.publisherIEEE MTT-S International Microwave Symposium
dc.relationIEEE MTT-S International Microwave Symposium;2006
dc.rightshttp://quijote.biblio.iteso.mx/licencias/CC-BY-NC-ND-2.5-MX.pdf
dc.subjectNeural Space Mapping (NSM)
dc.subjectElectromagnetic Based Design
dc.subjectBroyden-Based Linear Input Mapping
dc.subjectElectromagnetic Based Yield Prediction
dc.titleEM-based statistical analysis and yield estimation using linear-input and neural-output space mapping
dc.typeinfo:eu-repo/semantics/conferencePaper


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