Aberration-corrected electron microscopy of nanoparticles

dc.creatorYacamán, Miguel José
dc.creatorSantiago, Ulises
dc.creatorMejía Rosales, Sergio
dc.date2015
dc.date.accessioned2017-03-06T12:07:01Z
dc.date.available2017-03-06T12:07:01Z
dc.identifierhttp://eprints.uanl.mx/8894/1/Aberration-Corrected%20Electron%20Microscopy%20of%20Nanoparticles.pdf
dc.identifierYacamán, Miguel José y Santiago, Ulises y Mejía Rosales, Sergio (2015) Aberration-corrected electron microscopy of nanoparticles. In: Aberration-corrected electron microscopy of nanoparticles. Springer International Publishing, Cham, pp. 1-29. ISBN 9783319151779
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/248183
dc.descriptionThe early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are explained, and the use of aberration-corrected microscopy in the study of nanostructures is exemplified in order to remark the features and challenges in the use of this measuring technique
dc.formattext
dc.languageen
dc.publisherSpringer International Publishing
dc.relationhttp://eprints.uanl.mx/8894/
dc.rightscc_by_nc_nd
dc.subjectQC Física
dc.titleAberration-corrected electron microscopy of nanoparticles
dc.typeCapítulos de libros
dc.typeArtículos de revistas


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