An indirect method to measure the electric charge deposited on insulators during PIXE analysis

dc.creatorDinator, M. I.
dc.creatorCancino, S. A.
dc.creatorMiranda, P. A.
dc.creatorMorales, J. R.
dc.creatorSeelenfreund, A.
dc.date.accessioned2018-12-20T14:11:41Z
dc.date.available2018-12-20T14:11:41Z
dc.date.created2018-12-20T14:11:41Z
dc.date.issued2007
dc.identifierNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Volumen 263, Issue 2, 2018, Pages 529-531
dc.identifier0168583X
dc.identifier10.1016/j.nimb.2007.07.011
dc.identifierhttps://repositorio.uchile.cl/handle/2250/154591
dc.description.abstractTotal charge deposited by a proton beam in an insulator during PIXE analysis has been indirectly determined using a Mylar film coated with cobalt. Elemental concentrations in the samples, pieces of volcanic glass, were obtained and compared to concentrations determined by ICP OES on the same samples. The strong agreement between these results shows the accuracy of the charge determined by this method. © 2007 Elsevier B.V. All rights reserved.
dc.languageen
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/3.0/cl/
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Chile
dc.sourceNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
dc.subjectConcentrations
dc.subjectElectric charge
dc.subjectObsidian rock
dc.subjectPIXE
dc.subjectThick target
dc.titleAn indirect method to measure the electric charge deposited on insulators during PIXE analysis
dc.typeArtículo de revista


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