Artículos de revistas
Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
Fecha
2014-08Registro en:
Sanjuan, Federico Ezequiel; Bockelt, Alexander; Vidal, Borja; Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement; Optical Society Of America; Applied Optics; 53; 22; 8-2014; 4910-4913
1559-128X
2155-3165
Autor
Sanjuan, Federico Ezequiel
Bockelt, Alexander
Vidal, Borja
Resumen
A processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products.