Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement

dc.creatorSanjuan, Federico Ezequiel
dc.creatorBockelt, Alexander
dc.creatorVidal, Borja
dc.date.accessioned2017-01-24T20:23:59Z
dc.date.accessioned2018-11-06T15:37:18Z
dc.date.available2017-01-24T20:23:59Z
dc.date.available2018-11-06T15:37:18Z
dc.date.created2017-01-24T20:23:59Z
dc.date.issued2014-08
dc.identifierSanjuan, Federico Ezequiel; Bockelt, Alexander; Vidal, Borja; Determination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement; Optical Society Of America; Applied Optics; 53; 22; 8-2014; 4910-4913
dc.identifier1559-128X
dc.identifierhttp://hdl.handle.net/11336/11863
dc.identifier2155-3165
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1899166
dc.description.abstractA processing technique for the determination of the average refractive index and thickness of a two-layer system is presented. It is based on a single measurement with a standard terahertz time-domain spectrometer and the multilayer system thickness. The technique relies on the interference caused by the main pulse with the echoes produced in each material. This approach allows noninvasive inspection of double-layer compound products.
dc.languageeng
dc.publisherOptical Society Of America
dc.relationinfo:eu-repo/semantics/altIdentifier/doi/https://doi.org/10.1364/AO.53.004910
dc.relationinfo:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/ao/abstract.cfm?uri=ao-53-22-4910
dc.rightshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.rightsinfo:eu-repo/semantics/restrictedAccess
dc.subjectOptical properties
dc.subjectSpectroscopy
dc.subjectInterference
dc.subjectTerahertz
dc.titleDetermination of refractive index and thickness of a multilayer structure with a single terahertz time domain spectroscopy measurement
dc.typeArtículos de revistas
dc.typeArtículos de revistas
dc.typeArtículos de revistas


Este ítem pertenece a la siguiente institución