Structural properties of buried conducting layers formed by very low energy ion implantation of gold into polymer

dc.creatorTeixeira, Fernanda de Sá
dc.creatorSalvadori, Maria Cecilia Barbosa da Silveira
dc.creatorCattani, Mauro Sergio Dorsa
dc.creatorBROWN, I. G.
dc.date.accessioned2012-04-18T23:54:23Z
dc.date.accessioned2018-07-04T14:38:20Z
dc.date.available2012-04-18T23:54:23Z
dc.date.available2018-07-04T14:38:20Z
dc.date.created2012-04-18T23:54:23Z
dc.date.issued2009
dc.identifierJOURNAL OF APPLIED PHYSICS, v.106, n.5, 2009
dc.identifier0021-8979
dc.identifierhttp://producao.usp.br/handle/BDPI/15961
dc.identifier10.1063/1.3212574
dc.identifierhttp://dx.doi.org/10.1063/1.3212574
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1612783
dc.description.abstractWe have investigated the fundamental structural properties of conducting thin films formed by implanting gold ions into polymethylmethacrylate (PMMA) polymer at 49 eV using a repetitively pulsed cathodic arc plasma gun. Transmission electron microscopy images of these composites show that the implanted ions form gold clusters of diameter similar to 2-12 nm distributed throughout a shallow, buried layer of average thickness 7 nm, and small angle x-ray scattering (SAXS) reveals the structural properties of the PMMA-gold buried layer. The SAXS data have been interpreted using a theoretical model that accounts for peculiarities of disordered systems.
dc.languageeng
dc.publisherAMER INST PHYSICS
dc.relationJournal of Applied Physics
dc.rightsCopyright AMER INST PHYSICS
dc.rightsopenAccess
dc.subjectconducting polymers
dc.subjectfilled polymers
dc.subjectgold
dc.subjection implantation
dc.subjectmetal clusters
dc.subjectplasma guns
dc.subjectpolymer films
dc.subjectpolymer structure
dc.subjecttransmission electron microscopy
dc.subjectX-ray scattering
dc.titleStructural properties of buried conducting layers formed by very low energy ion implantation of gold into polymer
dc.typeArtículos de revistas


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