Raman analysis of ferroelectric switching in niobium-doped lead zirconate titanate thin films
dc.creator | Ferrari Ramírez, Piero Antonio. | |
dc.creator | Ramos Moore, Esteban | |
dc.creator | Cabrera, Alejandro Leopoldo | |
dc.date.accessioned | 2016-05-10T18:17:00Z | |
dc.date.available | 2016-05-10T18:17:00Z | |
dc.date.created | 2016-05-10T18:17:00Z | |
dc.date.issued | 2014 | |
dc.identifier | 0040-6090 | |
dc.identifier | https://repositorio.uc.cl/handle/11534/14345 | |
dc.language | en | |
dc.relation | Thin Solid Films (556), p. 539-543. | |
dc.rights | acceso restringido | |
dc.title | Raman analysis of ferroelectric switching in niobium-doped lead zirconate titanate thin films | |
dc.type | artículo |