Artículos de revistas
On the Second-Order Statistics of Nakagami Fading Simulators
Registro en:
Ieee Transactions On Communications. Ieee-inst Electrical Electronics Engineers Inc, v. 57, n. 12, n. 3543, n. 3546, 2009.
0090-6778
WOS:000272721000007
10.1109/TCOMM.2009.12.080161
Autor
Santos, JCS
Yacoub, MD
Institución
Resumen
We derive important second-order statistics-joint distribution of the envelope and its time derivative, second-order distribution, autocorrelation, level crossing rate, and average fade duration-of an existing Nakagami fading simulator, and show that these statistics but the autocorrelation differ considerably from the well-established statistics of the classical simulator. 57 12 3543 3546