On the Second-Order Statistics of Nakagami Fading Simulators

dc.creatorSantos, JCS
dc.creatorYacoub, MD
dc.date2009
dc.dateDEC
dc.date2014-11-13T22:58:06Z
dc.date2015-11-26T17:11:58Z
dc.date2014-11-13T22:58:06Z
dc.date2015-11-26T17:11:58Z
dc.date.accessioned2018-03-29T00:00:26Z
dc.date.available2018-03-29T00:00:26Z
dc.identifierIeee Transactions On Communications. Ieee-inst Electrical Electronics Engineers Inc, v. 57, n. 12, n. 3543, n. 3546, 2009.
dc.identifier0090-6778
dc.identifierWOS:000272721000007
dc.identifier10.1109/TCOMM.2009.12.080161
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/68789
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/68789
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/68789
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1281225
dc.descriptionWe derive important second-order statistics-joint distribution of the envelope and its time derivative, second-order distribution, autocorrelation, level crossing rate, and average fade duration-of an existing Nakagami fading simulator, and show that these statistics but the autocorrelation differ considerably from the well-established statistics of the classical simulator.
dc.description57
dc.description12
dc.description3543
dc.description3546
dc.languageen
dc.publisherIeee-inst Electrical Electronics Engineers Inc
dc.publisherPiscataway
dc.publisherEUA
dc.relationIeee Transactions On Communications
dc.relationIEEE Trans. Commun.
dc.rightsfechado
dc.rightshttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dc.sourceWeb of Science
dc.subjectNakagami fading channels
dc.subjectsecond-order statistics
dc.subjectsimulation
dc.subjectChannels
dc.titleOn the Second-Order Statistics of Nakagami Fading Simulators
dc.typeArtículos de revistas


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